Toledo, JavierPost, ÁngelPlaza, José Fabián2024-02-062024-02-0620231742-6588https://hdl.handle.net/10115/29729In this work, a test set-up device is designed, developed and manufactured to perform a direct measurement of the current emission enhancement that the photon absorption can bring to the thermionic emission in a Photon-Enhanced Thermionic Emission Device (PETED) where the C12A7:e- electride is used as the semiconductor due to its low work function value of 2.4 eV. Even though the measured thermionic emission starts at low operational temperatures, obtaining for example a current density emission of 5 mA/cm2 at 500 °C, there is barely an increase of 1% in the current emission when the device is exposed to a source of photons. This effect is mainly due to the presence of a dielectric layer at the material surface, which acts as a barrier, reduces the current enhancement effect from photon excitation, and drives to a limited efficiency of 27 μA/cm2/W.engAttribution 4.0 Internationalhttps://creativecommons.org/licenses/by/4.0/Electric excitationPhotonsCurrent emissionsEmission enhancementelectrideMeasurement of the C12A7:e- thermionic emission enhancement due to photon exposureinfo:eu-repo/semantics/conferenceObject10.1088/1742-6596/2526/1/012111info:eu-repo/semantics/openAccess