Browsing by Author "Sáenz, Juan J."
Now showing items 1-4 of 4
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Differential conductance in atomic-scale metallic contacts
García-Martín, A.; López-Ciudad, T.; Torres, J.A.; Caamaño, Antonio J.; Pascual, J.I; [et al.] (Elsevier, 1998) -
Electrostatic forces between sharp tips and metallic and dielectric samples
Gómez-Moñivas, S.; Froufé-Pérez, L.S.; Caamaño, Antonio J.; Sáenz, Juan J. (American Institute of Physics, 2001-12) -
Field emission interferometry with the scanning tunneling microscope
Caamaño, Antonio J.; Pogorelov, Yuri; Custance, Oscar; Méndez, Javier; Baró, Arturo M.; [et al.] (Elsevier, 1999)