Examinando por Autor "Castilla, Elena"
Mostrando 1 - 2 de 2
- Resultados por página
- Opciones de ordenación
Ítem A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing(Wiley, 2024-02-12) Castilla, ElenaOne-shot device testing data are used only once and they get destroyed when tested. As these products usually have large mean times to failure under normal operating conditions, accelerated life tests are commonly used to infer their lifetime distribution. While much work has been done to determine the maximum likelihood estimates (MLEs) of model parameters for one-shot device accelerated life testing, the efficiency of these methods may not be guaranteed for small to moderate sample sizes. In this paper, we develop new estimators and confidence intervals based on phi-divergences, we show that they outperform the conventional MLE under different lifetime distributions and present an example to illustrate all the inferential methods developed hereÍtem A New Robust Approach for Multinomial Logistic Regression With Complex Design Model(IEEE, 2022-06-29) Castilla, Elena; Chocano, Pedro J.Robust estimators and Wald-type tests are developed for the multinomial logistic regression based on φ-divergence measures. We compute the influence function of the proposed estimators and tests and discuss some consequences. Their robustness is illustrated by an extensive simulation study and two real examples.