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Field emission interferometry with the scanning tunneling microscope

dc.contributor.authorCaamaño, Antonio J.
dc.contributor.authorPogorelov, Yuri
dc.contributor.authorCustance, Oscar
dc.contributor.authorMéndez, Javier
dc.contributor.authorBaró, Arturo M.
dc.contributor.authorVeuillen, J.Y.
dc.contributor.authorGómez-Rodríguez, José M.
dc.contributor.authorSáenz, Juan J.
dc.identifier.citationSurface Science, 426 (1999) L420-L425es
dc.description.abstractA scanning tunneling microscope, operated in the near field emission regime, is used to obtain the phases of very low energy electrons reflected from a sample surface. A simple theoretical model shows that the spectrum of the electron standing waves, formed in the vacuum gap between the tip probe and the sample, is directly related to the complex amplitudes of the reflected electron waves. The surface sensitivity of the interferometric spectra is demonstrated in the analysis of different reconstructions of the Pb/Si(111)
dc.description.sponsorshipDGCyT PB950061 and PB95-0169 DGCyT FPI Grant IN92-D00830413es
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.titleField emission interferometry with the scanning tunneling microscopees
dc.subject.unesco3325 Tecnología de las Telecomunicacioneses
dc.subject.unesco22 Físicaes
dc.description.departamentoTeoría de la Señal y Comunicaciones

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Atribución-NoComercial-SinDerivadas 3.0 EspañaExcept where otherwise noted, this item's license is described as Atribución-NoComercial-SinDerivadas 3.0 España