Unveiling single-electron tunneling in nanogranular ultrathin films for sensor applications via hyperspectral conductive AFM

dc.contributor.authorBakkali, Hicham
dc.contributor.authorDominguez, Manuel
dc.date.accessioned2025-02-05T09:03:16Z
dc.date.available2025-02-05T09:03:16Z
dc.date.issued2025-03-01
dc.descriptionWe would like to thank Dr M. Febvre (Bruker) for his support with the sample measurements. M.D. acknowledged the support by the Spanish “Ministerio de Ciencia, Innovación y Universidades” under project EQC2018-004704-P
dc.description.abstractThis study maps the electrical behavior across a 7 × 7 μm2 nanogranular ultrathin Pd-ZrO2 film, revealing nonlinear I-V characteristics indicative of single-electron tunneling. Following the Coulomb blockade power law I ∼ (V − Vt)ξ with a scaling exponent ξ ≈ 1.2, these characteristics appear above the threshold voltage Vt. By modeling the nanogranular structure as a 1D array of multitunnel junctions, we demonstrate a linear relationship between Vt and tunnel channel length, allowing for a better understanding of nanoscale electrical properties and supporting the development of sensitive sensors
dc.identifier.citationHicham Bakkali, Manuel Dominguez, Unveiling single-electron tunneling in nanogranular ultrathin films for sensor applications via hyperspectral conductive AFM, Materials Letters, Volume 382, 2025, 137932, ISSN 0167-577X, https://doi.org/10.1016/j.matlet.2024.137932
dc.identifier.doihttps://doi.org/10.1016/j.matlet.2024.137932
dc.identifier.issn0167-577X (print)
dc.identifier.issn1873-4979 (online)
dc.identifier.urihttps://hdl.handle.net/10115/74977
dc.language.isoen
dc.publisherElsevier
dc.rightsAttribution 4.0 Internationalen
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectNanogranular ultrathin films
dc.subjectElectrical characteristics
dc.subjectConductive atomic force microscopy
dc.subjectSingle-electron tunneling
dc.titleUnveiling single-electron tunneling in nanogranular ultrathin films for sensor applications via hyperspectral conductive AFM
dc.typeArticle

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